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Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier.

Contributor(s): Weiss, Richard J. (Richard Jerome), 1923- | Chartier, Duane R | Society of Photo-optical Instrumentation Engineers | International Center for Art Intelligence | Fakes, Forgeries, and Experts (Organization)
Language: English Publisher: Hackensack, N.J. : World Scientific, c2004.Description: x, 317 p., [64] p. of plates : ill. (some col.) ; 23 cm.ISBN: 9812560254; 9789812560254Other title: Scientific detection of fakery in art and philatelySubject(s): Art -- Forgeries -- Congresses | Art -- Radiography -- Congresses | Art -- Expertising -- Congresses | Expertising, X-ray -- Congresses | Science and the arts -- Congresses | Art and science -- CongressesLOC classification: N8790 | .F32 2004Other classification: 30.30
Holdings
Item type Home library Collection Shelving location Call number Copy number Status Date due Barcode
Book British Museum
Conservation and Scientific Research Conservation & Scientific Research N8790.F32 2004 (Browse shelf(Opens below)) 1 Available 00061547

"Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."

Includes bibliographical references.