Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier.
Contributor(s): Weiss, Richard J. (Richard Jerome)
| Chartier, Duane R | Society of Photo-optical Instrumentation Engineers | International Center for Art Intelligence | Fakes, Forgeries, and Experts (Organization)
Language: English Publisher: Hackensack, N.J. : World Scientific, c2004.Description: x, 317 p., [64] p. of plates : ill. (some col.) ; 23 cm.ISBN: 9812560254; 9789812560254Other title: Scientific detection of fakery in art and philatelySubject(s): Art -- Forgeries -- Congresses | Art -- Radiography -- Congresses | Art -- Expertising -- Congresses | Expertising, X-ray -- Congresses | Science and the arts -- Congresses | Art and science -- CongressesLOC classification: N8790 | .F32 2004Other classification: 30.30
| Item type | Home library | Collection | Shelving location | Call number | Copy number | Status | Date due | Barcode | Item holds | |
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Book
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British Museum | Conservation and Scientific Research | Conservation & Scientific Research | N8790.F32 2004 (Browse shelf(Opens below)) | 1 | Available | 00061547 |
"Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
Includes bibliographical references.