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Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
Contributor(s): Goldstein, Joseph
Language: English Publisher: New York : Kluwer Academic/Plenum Publishers, c2003 printing, c1992.Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.).ISBN: 0306472929Subject(s): Scanning electron microscopy | X-ray microanalysisDDC classification: 502/.8/25 LOC classification: QH212.S3 | S29 2003
| Item type | Home library | Collection | Shelving location | Call number | Copy number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|---|
Book
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British Museum | Conservation and Scientific Research | Conservation & Scientific Research | QH212.S3 S29 2003 (Browse shelf(Opens below)) | 1 | Available | 00079097 |
Total holds: 0
Originally published 1992.
Includes bibliographical references and index.